{"id":858,"date":"2017-08-03T03:13:00","date_gmt":"2017-08-02T18:13:00","guid":{"rendered":"http:\/\/www.comm.tcu.ac.jp\/nano_slabo\/?p=858"},"modified":"2023-06-18T03:13:46","modified_gmt":"2023-06-17T18:13:46","slug":"%e5%9b%bd%e9%9a%9b%e4%bc%9a%e8%ad%b0-icds201729th-international-conference-on-defects-in-semiconductors","status":"publish","type":"post","link":"https:\/\/www.comm.tcu.ac.jp\/nano_slabo\/blog\/2017\/08\/03\/%e5%9b%bd%e9%9a%9b%e4%bc%9a%e8%ad%b0-icds201729th-international-conference-on-defects-in-semiconductors\/","title":{"rendered":"\u56fd\u969b\u4f1a\u8b70 ICDS2017(29th International Conference on Defects in Semiconductors)"},"content":{"rendered":"\n
\u5cf6\u6839\u770c\u306e\u677e\u6c5f\u304f\u306b\u3073\u304d\u30e1\u30c3\u30bb\u3067\u958b\u50ac\u3055\u308c\u305f\u3001\u534a\u5c0e\u4f53\u306e\u6b20\u9665\u306b\u95a2\u3059\u308b\u56fd\u969b\u4f1a\u8b70 ICDS2017(29th International Conference on Defects in Semiconductors) \u306b\u3066 M2 \u6b64\u5cf6\u3055\u3093\u3001M1 \u5927\u6728\u541b\u304c\u767a\u8868\u3057\u307e\u3057\u305f\u3002<\/p>\n\n\n\n
\u767a\u8868\u30bf\u30a4\u30c8\u30eb<\/p>\n\n\n\n
\u5927\u6728 \u5065\u53f8<\/p>\n\n\n\n
\u300cEffects of ion implantation defects on strain relaxation of SiGe layers on Si(110)\u300d<\/p>\n\n\n\n
\u6b64\u5cf6 \u5fd7\u7e54<\/p>\n\n\n\n
\u300cFormation of uniaxially strained Ge by local introduction of ion implantation defects\u300d<\/p>\n\n\n\n<\/figure>\n","protected":false},"excerpt":{"rendered":"\u5cf6\u6839\u770c\u306e\u677e\u6c5f\u304f\u306b\u3073\u304d\u30e1\u30c3\u30bb\u3067\u958b\u50ac\u3055\u308c\u305f\u3001\u534a\u5c0e\u4f53\u306e\u6b20\u9665\u306b\u95a2\u3059\u308b\u56fd\u969b\u4f1a\u8b70 ICDS2017(29th International Conference on Defects in Semiconductors) \u306b\u3066 M2 […]","protected":false},"author":6,"featured_media":0,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[2],"tags":[],"class_list":["post-858","post","type-post","status-publish","format-standard","hentry","category-news"],"_links":{"self":[{"href":"https:\/\/www.comm.tcu.ac.jp\/nano_slabo\/wp-json\/wp\/v2\/posts\/858","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.comm.tcu.ac.jp\/nano_slabo\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.comm.tcu.ac.jp\/nano_slabo\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.comm.tcu.ac.jp\/nano_slabo\/wp-json\/wp\/v2\/users\/6"}],"replies":[{"embeddable":true,"href":"https:\/\/www.comm.tcu.ac.jp\/nano_slabo\/wp-json\/wp\/v2\/comments?post=858"}],"version-history":[{"count":0,"href":"https:\/\/www.comm.tcu.ac.jp\/nano_slabo\/wp-json\/wp\/v2\/posts\/858\/revisions"}],"wp:attachment":[{"href":"https:\/\/www.comm.tcu.ac.jp\/nano_slabo\/wp-json\/wp\/v2\/media?parent=858"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.comm.tcu.ac.jp\/nano_slabo\/wp-json\/wp\/v2\/categories?post=858"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.comm.tcu.ac.jp\/nano_slabo\/wp-json\/wp\/v2\/tags?post=858"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}
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<\/figure>\n","protected":false},"excerpt":{"rendered":"\u5cf6\u6839\u770c\u306e\u677e\u6c5f\u304f\u306b\u3073\u304d\u30e1\u30c3\u30bb\u3067\u958b\u50ac\u3055\u308c\u305f\u3001\u534a\u5c0e\u4f53\u306e\u6b20\u9665\u306b\u95a2\u3059\u308b\u56fd\u969b\u4f1a\u8b70 ICDS2017(29th International Conference on Defects in Semiconductors) \u306b\u3066 M2 […]","protected":false},"author":6,"featured_media":0,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[2],"tags":[],"class_list":["post-858","post","type-post","status-publish","format-standard","hentry","category-news"],"_links":{"self":[{"href":"https:\/\/www.comm.tcu.ac.jp\/nano_slabo\/wp-json\/wp\/v2\/posts\/858","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.comm.tcu.ac.jp\/nano_slabo\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.comm.tcu.ac.jp\/nano_slabo\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.comm.tcu.ac.jp\/nano_slabo\/wp-json\/wp\/v2\/users\/6"}],"replies":[{"embeddable":true,"href":"https:\/\/www.comm.tcu.ac.jp\/nano_slabo\/wp-json\/wp\/v2\/comments?post=858"}],"version-history":[{"count":0,"href":"https:\/\/www.comm.tcu.ac.jp\/nano_slabo\/wp-json\/wp\/v2\/posts\/858\/revisions"}],"wp:attachment":[{"href":"https:\/\/www.comm.tcu.ac.jp\/nano_slabo\/wp-json\/wp\/v2\/media?parent=858"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.comm.tcu.ac.jp\/nano_slabo\/wp-json\/wp\/v2\/categories?post=858"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.comm.tcu.ac.jp\/nano_slabo\/wp-json\/wp\/v2\/tags?post=858"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}